X-ray interferometric study of the stress-deformed state of crystalline materials

Abstract

The results of the investigation of deformation fields in a special silicon triple-crystal X-ray interferometer unit under external stress by means of Moiré X-ray-diffraction patterns are presented. The values of the dislocation deformation and the components of the elastic deformation are calculated. It is shown that for a crystal containing dislocations, the value of the elastic modulus decreases. The distribution of the modulus of elasticity in real crystals is determined.