External and internal reflection near field microscopy: experiments and results

D. Courjon, J. M. Vigoureux, M. Spajer, Khaled Sarayeddine, S. Leblanc

Applied Optics · 1990 · 143 citations · 28 references

Concepts

Abstract

Two configurations of a scanning near field optical microscope working in reflection are presented. Results exhibiting nanometric resolution are given and discussed.

References

28