A structural study of the A1-Ge(001) interface using total-reflected x-ray diffraction - Concepedia

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A structural study of the A1-Ge(001) interface using total-reflected x-ray diffraction

13

Citations

1

References

1980

Year

Shang-Lin Weng, A.Y. Cho, W. C. Marra, P. Eisenberger

Solid State Communications

Materials EngineeringMaterials ScienceTotal-reflected X-ray DiffractionSurface CharacterizationEngineeringInterface StructurePhysicsSurface AnalysisSurface ScienceApplied PhysicsX-ray DiffractionStructural StudyCrystallographyInterface Property

References

	Year	Citations

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