Oxidation and Reduction of Ultrathin Nanocrystalline Ru Films on Silicon:  Model System for Ru-Capped Extreme Ultraviolet Lithography Optics

Abstract

Ultrathin ruthenium films are promising capping layers protecting extreme ultraviolet lithography optics against carbon growth and oxidation. The structure and reactivity of 2, 5, and 7 nm thick nanocrystalline Ru films on Si (serving as a model system for Ru capping layers) were studied by multiple techniques including scanning electron microscopy, X-ray diffraction, X-ray reflectivity, and X-ray photoelectron spectroscopy. The structural analysis indicated dense and flat Ru films, consisting of preferentially (0001)-oriented grains. High resolution core-level Ru 3d 5/2 and O 1s spectroscopy studies have revealed that these Ru films exposed to O 2 ambient are resistant to oxidation up to ∼470 K similar to the oxidation of single-crystalline Ru(0001) surfaces. The reduction of the oxide in the H 2 ambient is highly effective and proceeds already below 370 K.