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Effect of C60 ion sputtering on the compositional depth profiling in XPS for Li(Ni,Co,Mn)O2 electrodes

Materials ScienceChemical EngineeringEngineeringCompositional Depth ProfilingElectrode-electrolyte InterfaceSurface ElectrochemistryLithium-ion BatteryC60 IonElectrochemical ProcessO2 ElectrodesElectrochemistry