Publication | Closed Access
Surface characteristics and damage of monocrystalline silicon induced by wire-EDM
47
Citations
19
References
2014
Year
Materials ScienceMaterials EngineeringEngineeringSurface ScienceApplied PhysicsSemiconductor Device FabricationElectronic PackagingMonocrystalline SiliconMicroelectronicsSilicon On InsulatorMicrostructureSilicon Debugging
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