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Determination of the spin-exchange interaction constant in wurtzite GaN
99
Citations
14
References
1998
Year
Materials ScienceSpintronicsWide-bandgap SemiconductorAluminium NitrideEngineeringPhysicsApplied PhysicsQuantum MaterialsCondensed Matter PhysicsOscillator StrengthsAluminum Gallium NitrideGan Power DeviceSpin-exchange EnergyWurtzite GanCategoryiii-v Semiconductor
Wurtzite GaN grown onto an $A$-plane sapphire exhibits a uniaxial strain because the thermal expansion coefficient of the substrate is anisotropic. Measuring the dependence of the transition energies and of the oscillator strengths on the polarization of light, we deduced the value of the spin-exchange energy in wurtzite GaN: $\ensuremath{\gamma}\ensuremath{\approx}0.6\ifmmode\pm\else\textpm\fi{}0.1$ meV.
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