Crystal Research and Technology · 1984 · 87 citations · 0 references
Natural SciencesMaterials EngineeringMaterials ScienceElectronic MaterialsMaterials ChemistryThin FilmsOxide SemiconductorsAnodizationChemical PropertiesOxide Layer FormationOxide Layer MorphologyOxide StructureThin Oxide LayersThin-film Oxides
Abstract Oxide layers produced by ANOF technique show other structures and properties than such ones anodized as usual. Some characteristic mechanical, electrical and chemical properties are described. Their dependence on structure is discussed.