Quantitative XPS imaging—new possibilities with the delay-line detector

Identification of chemical components in XPS spectra and images using multivariate statistical analysis methods

Kateryna Artyushkova, Julia E. Fulghum · Journal of Electron Spectroscopy and Related Phenomena · 2001 · 60 citations

Natural Sciences, Chemical Engineering, Chemistry +13

Imaging XPS—A new technique, I—principles

N. Gurker, Maria F. Ebel, H. Ebel · Surface and Interface Analysis · 1983 · 59 citations

Natural Sciences, Materials Engineering, Materials Science +9

Multivariate image analysis methods applied to XPS imaging data sets

Kateryna Artyushkova, Julia E. Fulghum · Surface and Interface Analysis · 2002 · 46 citations

Natural Sciences, Materials Engineering, Material Visualization +15

Recent developments in high energy and spatial resolution analysis of polymers by XPS

Julia E. Fulghum · Journal of Electron Spectroscopy and Related Phenomena · 1999 · 40 citations

Natural Sciences, Materials Engineering, Materials Science +14

Quantitative surface chemical‐state microscopy by x‐ray photoelectron spectroscopy

John Walton, Neal Fairley · Surface and Interface Analysis · 2004 · 37 citations

Natural Sciences, Chemistry, Materials Science +17