Effects of activation by proton irradiation on silicon particle detector electric characteristics

Abstract

After irradiation with 7 and 9 MeV protons, activation-induced effects were encountered in measurements of current-voltage (IV) and capacitance-voltage (CV) characteristics for Czochralski and float-zone grown silicon particle detectors prepared on printed circuit boards with copper electrodes. With the present detector construction, the S30i(p,n)P30 and C63u(p,n)Z63n reactions induce dominant interference in such measurements. The daughter nuclides are positron emitters with half-lives of 2.5 and 38.5 min, respectively, and the slowing down of the emitted positrons generates a significantly large concentration of electron-hole pairs in the detector volume increasing the leakage current level and decreasing the breakdown voltage. The observed time-dependent characteristics were verified by modeling the activation of the detector structure and the resulting leakage current. As a result, the electrical measurements cannot be performed immediately after irradiation due to silicon activation, and, generally, materials becoming easily activated should be avoided in the detector concept.