Local layer structure of the steep field line defect in surface-stabilized ferroelectric liquid crystal cells

Abstract

Abstract The local layer structure of one type of DC electric field induced line defect observed in CS-1014 surface stabilized ferroelectric liquid crystal electro-optic cells has been determined using X-ray scattering and optical microscopy. The characterized defect is a high contrast defect line distinct from other field lines in that a defect mirror image is not produced when the DC field direction is reversed.