Ellipsometric investigation of chemisorption on clean silicon (111) and (100) surfaces

References

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	Year	Citations
Optical properties and electronic structure of amorphous Ge and Si J. Tauc Materials Research Bulletin Materials ScienceOptical MaterialsEngineeringOptical PropertiesApplied Physics	1968	3.4K
Ellipsometry in the Measurement of Surfaces and Thin Films Eliο Passaglia, R. R. Stronberg, Jörg Krüger, Journal of The Electrochemical Society Surface CharacterizationEngineeringSurface ScienceApplied PhysicsThin Film Process Technology	1965	208
Ellipsometry in the sub-monolayer region G.A. Bootsma, F. Meyer Surface Science Surface CharacterizationEngineeringGeometryMicroscopySurface Analysis	1969	196
Measurement of oxygen adsorption on silicon by ellipsometry R. J. Archer, G. W. Gobeli Journal of Physics and Chemistry of Solids EngineeringSurface ScienceChemisorptionAnalytical ChemistryAdsorption	1965	116
Optical Field Effect in Silicon B. O. Seraphin Physical Review PhotonicsOptical MaterialsAc Electric FieldEngineeringPhysics	1965	94
Effect of a Thin Surface Film on the Ellipsometric Determination of Optical Constants* D. K. Burge, H. E. Bennett Journal of the Optical Society of America	1964	88
A low energy electron diffraction study of the PH3 adsorption on the Si (111) surface A.J. Van Bommel, F. Meyer Surface Science Surface CharacterizationEngineeringSurface ChemistrySurface AnalysisPh3 Adsorption	1967	59
Ellipsometric investigation of physisorption at low temperatures G.A. Bootsma, F. Meyer Surface Science Ellipsometric InvestigationEngineeringChemisorptionPhysical ChemistryAnalytical Chemistry	1969	22

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