A New Microwave Axial Tomograph for the Inspection of Dielectric Materials

Abstract

In this paper, the development of a microwave axial tomograph for the inspection of dielectric materials is discussed. In particular, hardware and software solutions are pointed out. An experimental bistatic imaging setup is described. Moreover, the results of several forward-scattering simulations, which are aimed at defining suitable working conditions, are reported. Finally, to invert the collected field-scattered data, a deterministic inexact Newton method is applied. The approach is evaluated by using synthetic data, and the results of a preliminary experimental reconstruction are reported.