Antireflection design concepts with equivalent layers

Abstract

Some novel concepts of designing antireflection (AR) coatings with equivalent layers are presented. As an introduction, essential papers concerning thin-film optics and AR designs are cited, and the AR problem and a previously introduced AR-hard design type are discussed. Based on the known matrix formalism, a potential AR region, an equivalent stack index, and an equivalent substrate index are defined to use the theory of stop-band suppression as a starting point for the design of broadband AR coatings. The known multicycle AR design type is identified as a typical solution to the AR problem if the presented approach is used.