Publication | Closed Access
High operating temperature 320×256 middle-wavelength infrared focal plane array imaging based on an InAs∕InGaAs∕InAlAs∕InP quantum dot infrared photodetector
72
Citations
9
References
2007
Year
Short Wavelength OpticEngineeringOptical TestingOptoelectronic DevicesFocal Plane ArrayHigh Temperature ImagingPhotodetectorsOptical PropertiesInas∕ingaas∕inalas∕inp Quantum DotBarrier DetectorInfrared OpticOptical SystemsPhotonicsPhysicsInfrared TechnologyOptoelectronic MaterialsThermal PhysicsNear-infrared SpectroscopyOptical SensorsInfrared SensorApplied PhysicsOptical EngineeringOptoelectronicsInfrared Systems
This letter reports a 320×256 middle-wavelength infrared focal plane array operating at temperatures up to 200K based on an InAs quantum dot/InGaAs quantum well/InAlAs barrier detector grown on InP substrate by low pressure metal organic chemical vapor deposition. The device’s low dark current density and the persistence of the photocurrent up to room temperature enabled the high temperature imaging. The focal plane array had a peak detection wavelength of 4μm, a responsivity of 34mA∕W, a conversion efficiency of 1.1%, and a noise equivalent temperature difference of 344mK at an operating temperature of 120K.
| Year | Citations | |
|---|---|---|
Page 1
Page 1