Sensitivity in light element analysis by 2 MeV and 150 keV proton and photon induced X-rays

X-ray analysis: Elemental trace analysis at the 10−12 g level

T. Johansson, Roland Akselsson, Sven Johansson · Nuclear Instruments and Methods · 1970 · 482 citations

Natural Sciences, Chemistry, Materials Science +9

Proton induced X-ray emission as a tool for trace element analysis

F. Folkmann, C. Gaarde, Torben Huus et al. · Nuclear Instruments and Methods · 1974 · 285 citations

Natural Sciences, Chemistry, Radiology +14

Comparison of particle and photon excited X-ray fluorescence applied to trace element measurements of environmental samples

J.A. Cooper · Nuclear Instruments and Methods · 1973 · 104 citations

Natural Sciences, Chemistry, Environmental Sciences +16

Sensitivity in trace-element analysis by p, α and 16O induced X-rays

F. Folkmann, J. Borggreen, Amanda Kjeldgaard · Nuclear Instruments and Methods · 1974 · 88 citations

Natural Sciences, Chemistry, Elemental Analysis +9

XRF analysis - some sensitivity comparisons between charged-particle and photon excitation

F.S. Goulding, J.M. Jaklevic · Nuclear Instruments and Methods · 1977 · 76 citations · Full text

Natural Sciences, Materials Science, Physics +13