The measurement of threading dislocation densities in semiconductor crystals by X-ray diffraction

The estimation of dislocation densities in metals from X-ray data

Peter Gay, P. B. Hirsch, Anthony E. Kelly · Acta Metallurgica · 1953 · 520 citations

Natural Sciences, Materials Engineering, Materials Science +14

Comparison of dislocation densities of primary and secondary recrystallization grains of Si-Fe

C. G. Dunn, E.F Kogh · Acta Metallurgica · 1957 · 368 citations

Natural Sciences, Materials Engineering, Materials Science +14

Characterization of thin layers on perfect crystals with a multipurpose high resolution x-ray diffractometer

W. Bartels · Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena · 1983 · 320 citations

Natural Sciences, Materials Engineering, Materials Science +17

Theory of the Use of More Than Two Successive X-Ray Crystal Reflections to Obtain Increased Resolving Power

Jesse W. M. DuMond · Physical Review · 1937 · 257 citations

Natural Sciences, Materials Science, Optics +12

The interpretation of X-ray rocking curves from III–V semiconductor device structures

M. A. G. Halliwell, M. H. Lyons, M. J. Hill · Journal of Crystal Growth · 1984 · 232 citations

Natural Sciences, Electrical Engineering, Materials Science +9