Publication | Closed Access

The measurement of threading dislocation densities in semiconductor crystals by X-ray diffraction

Materials ScienceDislocation DensitiesEngineeringSevere Plastic DeformationPhysicsDislocation InteractionX-ray DiffractionApplied PhysicsCondensed Matter PhysicsSemiconductor CrystalsMicrostructure-strength RelationshipDefect FormationCrystallographyMicrostructure