A double-frame nanosecond soft X-ray backlighting system based on X-pinches

Abstract

The operation of a double-frame soft X-ray backlighting system on the basis of two table-top pulsed power generators and X-pinches is described. The system allows one to obtain two backlighting frames of a fast process with a nanosecond exposure (2–3 ns), a micrometer spatial resolution, and an adjustable delay between the frames. Backlighting registration of electrically exploding single aluminum wires was performed in the spectral range hν > 0.8 keV of the backlighting source using the double-frame system. The jitter time between X-ray pulses was within ±18 ns.