Publication | Closed Access
XPS studies and factor analysis of PbS nanocrystal-doped SiO2 thin films
34
Citations
26
References
1999
Year
Materials ScienceIi-vi SemiconductorEngineeringNanomaterialsOxide ElectronicsApplied PhysicsFactor AnalysisSemiconductor MaterialThin FilmsNanocrystalline MaterialXps Studies
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