Zeitschrift für Naturforschung A · 1972 · 149 citations · 1 references
Natural SciencesMaterials SciencePhysicsCondensed Matter PhysicsDefect CharacterizationDefectsElectron Beam PhysicsElectron MicroscopyHigh-resolution Electron MicroscopyLattice DefectsScanning Electron Microscopy
Abstract The geometry of lattice defects can be studied in detail using the weak-beam method 1 of high resolution electron microscopy. In this paper the theoretical basis of the method is discussed, and the experimental conditions which are necessary if particular methods of image interpretation are to be used are considered.
1
Electron microscopy of thin crystals
M.E. Haine · Vacuum · 1966 · 2.4K citations