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Defect Cluster Centers in MgO
172
Citations
13
References
1969
Year
Cluster ComputingEngineeringDefect ToleranceCluster TechnologyIon ImplantationReliability EngineeringSystems EngineeringColored SamplesMaterials EngineeringMaterials SciencePhysicsNeutron SourceDefect FormationCrystallographyMgo Single CrystalsCondensed Matter PhysicsApplied PhysicsDefect Cluster CentersNeutron Scattering
A study of the production and annealing of defect cluster centers in MgO single crystals has been undertaken. A comparison of the annealing of single negative-ion vacancies in neutron-irradiated, electron-irradiated, and Mg-additively colored samples is made. The results indicate that isolated negative-ion vacancies are not mobile below 900\ifmmode^\circ\else\textdegree\fi{}C, and the annealing of these defects at lower temperatures in irradiated crystals is due to interstitial migration. The broad absorption bands at 352, 573, and 975 nm and the zero-phonon lines observed in neutron-irradiated crystals, previously proposed as due to $F$-aggregate centers, are not observed in electron-irradiated and additively colored samples even after annealing. Therefore, there is some uncertainity whether these lines and/or bands are due to $F$-aggregate centers.
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