Structural characterization of C <sub>60</sub> nanowhiskers formed by the liquid/liquid interfacial precipitation method

Kun’ichi Miyazawa, Y. Kuwasaki, Koichi Hamamoto, Satoru Nagata, M. Kuwabara

Surface and Interface Analysis · 2003 · 87 citations · 4 references

DOIFull text

Open access

Abstract

Abstract The structure of C 60 whiskers fabricated by using the liquid/liquid interfacial precipitation method is analysed with transmission electron microscopy (TEM). The C 60 whiskers with submicrometre diameters, named ‘C 60 nanowhiskers (C 60 NWs)’, contain (002) c planar faults, and the centre‐to‐centre distance between the C 60 molecules along the growth axis of C 60 NWs is shortened ∼1% compared with that of pristine C 60 crystals, indicating the formation of chemical bondings between the C 60 molecules along [110] c ([100] t ) close‐packed directions of the C 60 NWs. The electrical resistivity of C 60 whiskers decreased on decreasing their diameter. This result suggests that the C 60 NWs are electrically conductive. The C 60 whiskers are very flexible and could form a semicircle with a curvature radius of 38 µm. Copyright © 2003 John Wiley &amp; Sons, Ltd.

References

4