ON UNIFORMIZATION OF RIEMANN SURFACES AND THE WEIL-PETERSSON METRIC ON TEICHMÜLLER AND SCHOTTKY SPACES

Abstract

A potential is constructed for the Weil-Petersson metric on the Teichm?ller space of marked Riemann surfaces of genus 1$ SRC=http://ej.iop.org/images/0025-5734/60/2/A03/tex_sm_3170_img2.gif/> in terms of the density of the Poincar? metric on the region of discontinuity of the corresponding normalized marked Schottky group. It is proved that the difference between the projective connections corresponding to the Fuchsian uniformization and the Schottky uniformization for a marked Riemann surface of genus 1$ SRC=http://ej.iop.org/images/0025-5734/60/2/A03/tex_sm_3170_img2.gif/> is the -derivative of this potential, and the Weil-Petersson symplectic form on Teichm?ller space is the -derivative of the Fuchsian projective connection. The results establish how the accessory parameters of the Fuchsian uniformization and the Schottky uniformization of a Riemann surface are connected with the geometries of Teichm?ller space and Schottky space.Bibliography: 31 titles.