Finding all solutions of piecewise-linear resistive circuits using simple sign tests

Abstract

This paper presents an efficient algorithm for finding all solutions of piecewise-linear resistive circuits. The algorithm uses two types of sign tests; one is a new test that is proposed in this paper, and the other is the test proposed by Yamamura and Ochiai (1992). The computational complexity of the new test is much smaller than that of Yamamura and Ochiai's test. These tests eliminate many linear regions that do not contain a solution. Therefore, the number of simultaneous linear equations to be solved is substantially reduced. The proposed algorithm is very simple and efficient.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">&gt;</ETX>