Reducing the complexity of defect level modeling using the clustering effect

Abstract

Article Free Access Share on Reducing the complexity of defect level modeling using the clustering effect Authors: José T. de Sousa IST/INSEC, Technical University of Lisbon, R. Alves Redol, 1000 Lisboa, Portugal IST/INSEC, Technical University of Lisbon, R. Alves Redol, 1000 Lisboa, PortugalView Profile , Vishwani D. Agrawal Bell Labs, Lucent Technologies, Murray Hill, NJ Bell Labs, Lucent Technologies, Murray Hill, NJView Profile Authors Info & Claims DATE '00: Proceedings of the conference on Design, automation and test in EuropeJanuary 2000 Pages 640–644https://doi.org/10.1145/343647.343879Published:01 January 2000Publication History 10citation81DownloadsMetricsTotal Citations10Total Downloads81Last 12 Months7Last 6 weeks3 Get Citation AlertsNew Citation Alert added!This alert has been successfully added and will be sent to:You will be notified whenever a record that you have chosen has been cited.To manage your alert preferences, click on the button below.Manage my AlertsNew Citation Alert!Please log in to your account Save to BinderSave to BinderCreate a New BinderNameCancelCreateExport CitationPublisher SiteeReaderPDF