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Performance characteristics of a chemical imaging time-of-flight mass spectrometer
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1998
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The paper describes a chemical imaging time‑of‑flight secondary ion mass spectrometer. The instrument comprises a liquid metal ion gun, a medium‑energy‑resolution reflectron mass analyzer, a liquid‑nitrogen‑cooled sample stage, a preparation chamber, and a dual‑stage entry port, and offers laser post‑ionization compatibility, a large field of view, cryogenic handling, and high incident ion beam current. Performance is demonstrated by characterizing SEM grids, silver and functionalized polystyrene beads, and post‑ionizing an organic overlayer on gold. © 1998 John Wiley & Sons, Ltd.
A chemical imaging time-of-flight secondary ion mass spectrometer is described. It consists of a liquid metal ion gun, medium energy resolution reflectron mass analyzer, liquid nitrogen cooled sample stage, preparation chamber and dual stage entry port. Unique features include compatibility with laser postionization experiments, large field of view, cryogenic sample handling capability and high incident ion beam current. Instrument performance is illustrated by the characterization of scanning electron microscopy grids, silver and functionalized polystyrene beads and the postionization of an organic overlayer on a gold substrate. © 1998 John Wiley & Sons, Ltd.