Physical Review B · 2006 · 50 citations · 31 references
Natural SciencesMaterials ScienceSurface EngineeringSurface ScienceThin FilmsErosionErosion ProcessesSurface MorphologySurface RoughnessSurface TopographyThin Film Surface MorphologyLateral ErosionRipple FormationScaling AnalysisSputteringSputtering ProcessesSurface ErosionSurface Morphology EvolutionSurface Sputtering
We study solid surface morphology created by off-normal ion-beam sputtering with an atomistic solid-on-solid model of sputter erosion. With respect to an earlier version of the model, we extend this model with the inclusion of lateral erosion. Using the two-dimensional structure factor, we found an upper bound $\ensuremath{\mu}\ensuremath{\simeq}2$, in the lateral straggle $\ensuremath{\mu}$, for clear ripple formation. Above this upper bound, for longitudinal straggle $\ensuremath{\sigma}\ensuremath{\gtrsim}1.7$, we found the possibility of dot formation (without sample rotation). Moreover, a temporal crossover from a hole topography to ripple topography with the same value of collision cascade parameters was found. Finally, a scaling analysis of the roughness, using the consecutive gradient approach, yields the growth exponents $\ensuremath{\beta}=0.33$ and 0.67 for two different topographic regimes. The results are discussed in the context of the continuum theory.
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Dynamic Scaling of Growing Interfaces
Mehran Kardar, Giorgio Parisi, Yi-Cheng Zhang · Physical Review Letters · 1986 · 5.4K citations
Formation of Ordered Nanoscale Semiconductor Dots by Ion Sputtering
Stefan Facsko, T. Dekorsy, C. Koerdt et al. · Science · 1999 · 792 citations · Full text
Natural Sciences, Materials Engineering, Materials Science +15