Projectile charge-state dependence of<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mi>K</mml:mi></mml:math>-shell ionization by silicon ions: A comparison of Coulomb ionization theories for direct ionization and electron capture with x-ray production data

Abstract

X-ray-production cross sections measured in $K$-shell ionization of $_{21}\mathrm{Sc}$, $_{22}\mathrm{Ti}$, $_{29}\mathrm{Cu}$, and $_{32}\mathrm{Ge}$ by 52-MeV $_{14}^{28}\mathrm{Si}^{+q}$ projectiles with $q=7 \mathrm{to} 14$ are reported, which demonstrate, through their charge-state dependence, the validity of a recently developed electron-capture theory with a reduced binding effect. Furthermore, the data provide evidence for the applicability of the perturbed stationary-state theory of direct ionization for values of $0.44\ensuremath{\le}\frac{{Z}_{1}}{{Z}_{2}}\ensuremath{\le}0.67$.