Empirical Characterization of Low-Temperature Magnetoresistance Effects in Heavily Doped Ge and Si - Concepedia

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Empirical Characterization of Low-Temperature Magnetoresistance Effects in Heavily Doped Ge and Si

68

Citations

3

References

1963

Year

H. Roth, W. Sträub, W. Bernard, J. E. Mulhern

Physical Review Letters

MagnetismElectrical EngineeringHeavily Doped GeEngineeringPhysicsBias Temperature InstabilityApplied PhysicsLow-temperature Magnetoresistance EffectsEmpirical CharacterizationSilicon On InsulatorMagnetoresistanceSemiconductor Device

References

	Year	Citations

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