Publication | Closed Access
Optical Properties of NiO Thin Films Grown by Using Sputtering Deposition and Studied with Spectroscopic Ellipsometry
19
Citations
0
References
2008
Year
Materials ScienceOptical MaterialsEngineeringOptical PropertiesOxide ElectronicsSurface ScienceApplied PhysicsSpectroscopic EllipsometryThin FilmsPulsed Laser DepositionOptoelectronicsChemical Vapor DepositionThin Film Processing
No additional data available for this publication yet. Check back later!