Journal of the Korean Physical Society · 2008 · 19 citations · 0 references
Natural SciencesMaterials EngineeringMaterials ScienceOptical MaterialsOpticsThin FilmsOptical Thin FilmsThin Film Optical PropertiesThin-film DepositionThin-film MaterialsEllipsometryOptical PropertiesOptical Thin Film CharacterizationSpectroscopic EllipsometrySurface Optical PropertiesThin Oxide FilmsThin-film Optical Characterization