Processing and microstructural characterization of sputter-deposited Ni/Ni<sub>3</sub>Al multilayered thin films - Concepedia

Concepedia

Publication | Closed Access

Processing and microstructural characterization of sputter-deposited Ni/Ni<sub>3</sub>Al multilayered thin films

11

Citations

20

References

2003

Year

Evan A. Sperling, Rajarshi Banerjee, Gregory B. Thompson, Jason P. Fain, Peter M. Anderson, Hamish L. Fraser

Journal of materials research/Pratt's guide to venture capital sources

Materials ScienceEngineeringSurface ScienceApplied PhysicsThin Film DevicesThin Film Process TechnologyThin FilmsChemical Vapor DepositionThin Film ProcessingMicrostructure

References

	Year	Citations

Page 1