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Observations on Electrotransport in Thin Aluminum Films Using Resistance Measurements *
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1971
Year
EngineeringIon AccumulationChemical DepositionCorrosionCorrosion ResistanceProtective CoatingMaterials ScienceMaterials EngineeringElectrical EngineeringElectromigration TechniqueSio-overcoated Aluminum StripesElectrical PropertyElectrochemistrySpecific ResistanceSurface ScienceApplied PhysicsAbstract Resistance MeasurementsThin FilmsElectrical Insulation
Abstract Resistance measurements of five different portions of uncoated and partially SiO-overcoated aluminum stripes are reported. In specimens of both types the resistance increases at the cathode when the stripe is subjected to high current densities. In partially coated specimens the resistance decreases at the anode whereas it remains constant in the uncoated sample. The difference in behavior at the anode between coated and uncoated specimens is interpreted as being due to differences of ion accumulation: In the uncoated films hillocks are formed whereas in the specimen with partial overcoat the ions accumulate more to support this interpretation