Effect of Ar+-ion bombardment on the composition and structure of the surface of CoSi2/Si(111) nanofilms

S. B. Donaev, A. K. Tashatov

Journal of Surface Investigation X-ray Synchrotron and Neutron Techniques · 2015 · 27 citations · 7 references

Concepts

Abstract

The effect of Ar + -ion bombardment on the surface composition and structure of CoSi 2 /Si nano-films is studied. It is demonstrated that ion bombardment leads to the decomposition of CoSi 2 and enrichment of the film surface with Si atoms. After heating at T = 850–900 K, the Si-CoSi 2 -Si nanofilm system forms.

References

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