Rigorous optical modeling of multilayer organic light-emitting diode devices

Abstract

We present an exact classical solution to the problem of dipole emission in a planar multilayer light-emitting device. The inputs to the model are the photoluminescence and quantum yield of the emitter material, and the device layer thicknesses and indices of refraction. The results of the model are applied to predicting the radiant intensity of organic light-emitting diodes as a function of varying device layer thickness. It is shown that the predicted radiances are in excellent agreement with the data. We also present results for the Poynting power distribution from a randomly aligned dipole for positions both internal and external to the diodes.