Publication | Closed Access
Diffraction imaging of high quality bismuth silicon oxide with monochromatic synchrotron radiation: Implications for crystal growth
14
Citations
12
References
1988
Year
Materials ScienceEpitaxial GrowthEngineeringCrystal Growth TechnologyOxide ElectronicsApplied PhysicsSilicon On InsulatorDiffraction ImagingCrystallographyHigh Quality Bismuth
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