Progress of Phase-Change Single-Beam Overwrite Technology

Abstract

Studies on relationships between single beam overwrite characteristics and physical and chemical properties of the phase change recording media and their mechanisms are reviewed. Improvements in overwrite characteristics based on these studies, especially improvements in carrier to noise ratio(C/N) and the life of recorded dots by the addition of one of the transition metal elements or Tt are also reported. The maximum C/N was 61dB and the estimated life of the recorded dots is longer than 100 years at 60°C.