High-pressure studies on the electrical resistivity of As-Te glasses

S. S. K. Titus, S. Asokan, R. Raja Ramakrishna, E. S. R. Gopal

Philosophical Magazine B · 1990 · 12 citations · 7 references

Concepts

Abstract

Abstract Electrical resistivity measurements have been performed on bulk semiconducting As x Te100-x glasses (25 ≤ x ≤ 60) in a Bridgman anvil system. The resistivity of all the As x Ye100-x glassy samples decreases continuously with increasing pressure, reaching metallic values at around 5GPa. The high-pressure response of As x Te100-x glasses shows a very subtle change at x = 40. The observed subtle change in the high-pressure response as of As x Te100-x glasses at x=40 can be connected with the rigidity percolation occurring at this composition.

References

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