Low-temperature formation of epitaxial Tl2Ca2Ba2Cu3O10 thin films in reduced O2 pressure

W. Y. Lee, S. M. Garrison, M. Kawasaki, E.L. Venturini, Byung Tae Ahn, R. Boyers, J. Salem, R. Savoy, J. E. Vazquez

Applied Physics Letters · 1992 · 72 citations · 17 references

Concepts

Abstract

Epitaxial Tl2Ca2Ba2Cu3O10 films on (100) LaAlO3 are prepared by post-annealing 2Tl:2Ca:2Ba:3Cu precursor films at 830–860 °C in ≂0.03–0.15 atm of O2. These films (0.2–1.1 μm thickness) are smooth and shiny to the eye, and have a sharp zero resistance and onset diamagnetic transition temperature of 117–121 K. Transport critical current densities of 1.6×106 A/cm2 at 77 K and ≂105 A/cm2 at 100 K are obtained for a 0.38-μm-thick film in magnetic fields up to 100 Oe. Strong flux pinning at low temperatures is inferred from the weak-field dependence of the critical current density calculated from magnetic hysteresis loops. At 5 K, the best film has a magnetic critical current density of 9×106 A/cm2 in zero field, decreasing gradually to 1.5×106 A/cm2 in a 5-T field.

References

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