Detection of secondary electrons in a multidipole plasma

N. Hershkowitz, R. L. Goettsch, Chung Chan, Kyle J. Hendricks, R. T. Carpenter

Journal of Applied Physics · 1982 · 18 citations · 4 references

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Abstract

Secondary electrons are identified as a separate component within a plasma in a specifically modified multidipole device. It is shown that secondary electron emission at walls can be comparable to electron production by ionization. It is also shown that secondary electron emission can significantly change Langmuir probe characteristics.

References

4