Raman spectroscopy of laser ablated BaTiO3/YBa2Cu3O7−<i>x</i> thin film bilayer structure

Abstract

Raman scattering was used to characterize BaTiO3/YBa2Cu3O7−x thin film bilayer structure grown by pulsed laser ablation (PLA). The Raman spectra were compared with the x-ray diffraction (XRD) spectra. The Raman peaks due to the tetragonal phase of BaTiO3 (BTO) and to the 123 phase YBa2Cu3O7−x (YBCO) were observed at room temperature. XRD results showed that the BaTiO3 thin film has highly c-axis oriented tetragonal phase and is fully epitaxial. However, some impurity phases were observed from the Raman spectrum of the BaTiO3 thin film.