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CESIUM-GaAs SCHOTTKY BARRIER HEIGHT
25
Citations
4
References
1967
Year
SemiconductorsSemiconductor TechnologyElectrical EngineeringSchottky Barrier HeightEngineeringWide-bandgap SemiconductorPhysicsHeavy CoverageApplied PhysicsSemiconductor MaterialCesium MetalCompound Semiconductor
The Schottky barrier height at the interface of cesium metal and vacuum-cleaved p-type GaAs has been found to be 0.63 ± 0.03 eV. These measurements were made photovoltaically at 80°K and indicate that a heavy coverage of cesium leaves the surface roughly intrinsic.
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