Journal of Applied Physics · 2012 · 164 citations · 28 references
EngineeringSilicon On InsulatorThermal ConductivitySemiconductorsElectronic DevicesThermodynamicsThermal ConductionMaterials SciencePhysicsThermal TransportPhonon TransportHeat TransferHeat ConductionElectronic MaterialsFilm ThicknessApplied PhysicsPhononThin FilmsThermal EngineeringThermal PropertyThermal Properties
The question of what fraction of the total heat flow is transported by phonons with different mean-free-paths is addressed using a Landauer approach with a full dispersion description of phonons to evaluate the thermal conductivities of bulk and thin film silicon. For bulk Si, the results reproduce those of a recent molecular dynamic treatment showing that about 50% of the heat conduction is carried by phonons with a mean-free-path greater than about 1 μm. For the in-plane thermal conductivity of thin Si films, we find that about 50% of the heat is carried by phonons with mean-free-paths shorter than in the bulk. When the film thickness is smaller than ∼0.2 μm, 50% of the heat is carried by phonons with mean-free-paths longer than the film thickness. The cross-plane thermal conductivity of thin-films, where quasi-ballistic phonon transport becomes important, is also examined. For ballistic transport, the results reduce to the well-known Casimir limit [H. B. G. Casimir, Physica 5, 495–500 (1938)]. These results shed light on phonon transport in bulk and thin-film silicon and demonstrate that the Landauer approach provides a relatively simple but accurate technique to treat phonon transport from the ballistic to diffusive regimes.
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