Synchrotron X-Ray Diffraction Study of Third-Order Fibonacci Lattices

Abstract

Third-order Fibonacci lattices have been grown by means of molecular beam epitaxy. Many satellite peaks are observed by using synchrotron X-rays. A broad peak observed by a conventional diffraction method is found, at high resolution, to be a gathering of many sharp peaks. The satellite peaks are assigned by a power law, implying that the third-order Fibonacci lattices have a self-similar feature.