XPS analysis and structural and morphological characterization of Cu2ZnSnS4 thin films grown by sequential evaporation - Concepedia

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XPS analysis and structural and morphological characterization of Cu2ZnSnS4 thin films grown by sequential evaporation

71

Citations

21

References

2014

Year

G. Gordillo, C. Calderón, P. Bartolo‐Pérez

Applied Surface Science

Materials ScienceCu2znsns4 Thin FilmsSequential EvaporationMaterial AnalysisEngineeringIi-vi SemiconductorTransition Metal ChalcogenidesNanotechnologyXps AnalysisSurface ScienceApplied PhysicsChemistryThin FilmsLayered Material

References

	Year	Citations

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