Studies of Solid Interfaces Using Soft X-ray Emission Spectroscopy - Concepedia

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Studies of Solid Interfaces Using Soft X-ray Emission Spectroscopy

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Citations

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References

1998

Year

E.Z. Kurmaev, V. R. Galakhov, S. N. Shamin

Critical reviews in solid state and materials sciences/CRC critical reviews in solid state and materials sciences

Materials ScienceCritical ReviewsInterface PropertyX-ray SpectroscopyEngineeringMaterials SciencesSurface ScienceApplied PhysicsX-ray DiffractionInterfacial PhenomenaSolid StateX-ray Imaging

Abstract

(1998). Studies of Solid Interfaces Using Soft X-ray Emission Spectroscopy. Critical Reviews in Solid State and Materials Sciences: Vol. 23, No. 2, pp. 65-203.