Concepedia

Publication | Closed Access

Thin layer activation: A technique for monitoring material loss during high temperature surface degradation processes

DOI

13

Citations

5

References

1987

Year

J. Asher, M. J. Bennett, R. W. M. Hawes, J. B. Price, A.T. Tuson, David Savage, S. Sugden
Materials Science and Engineering

References

YearCitations

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