SURFACE ROUGHENING WITH QUENCHED DISORDER IN d-DIMENSIONS

Abstract

We review recent numerical simulations of several models of interface growth in d- dimensional media with quenched disorder. These models belong to the universality class of anisotropic diode-resistor percolation networks. The values of the roughness exponent α=0.63±0.01 (d=1+1) and α=0.48±0.02 (d=2+1) are in good agreement with our recent experiments. We study also the diode-resistor percolation on a Cayley tree. We find that [Formula: see text] thus suggesting that the critical exponent for [Formula: see text]β p =∞ and that the upper critical dimension in this problem is d=d c =∞. Other critical exponents on the Cayley tree are: τ=3,ν || =ν ⊥ =γ=σ=0. The exponents related to roughness are: α=β=0, z=2.