Journal of the Optical Society of America · 1958 · 22 citations · 3 references
Natural SciencesMaterials ScienceOpticsPhotonicsThin FilmsOptical Thin FilmsPhysical OpticsPolarization OpticsRefractive IndexThin Film Optical PropertiesThin-film MaterialsEllipsometryOptical ReflectanceThickness-dependent Optical Properties
A straightforward treatment of the properties of elliptically polarized light reflected from thin films has been made using only the laws of elementary optics. The results are shown to be in satisfactory agreement with experiment for films of thickness up to 1600 A, far beyond the region of validity of the Drude approximation for very thin films.
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