Bimolecular recombination in aggregate organic photoconductors

Abstract

Bimolecular recombination in xerographic photoconductors can contribute to effects which are essentially reciprocity failures. Such failures have been observed in aggregate photoconductors by comparing the surface potential—exposure behavior for low-intensity emission-limited discharge—with the behavior resulting from high-intensity flash exposures. The results show a high-intensity reciprocity failure which can be understood with a model based upon Langevin-type bimolecular recombination.