Publication | Closed Access
Thickness dependence of structural, optical and electrical properties of ZnO:Al films prepared on flexible substrates
142
Citations
9
References
2001
Year
Materials ScienceAluminium NitrideOptical MaterialsThickness DependenceEngineeringFlexible ElectronicsMaterial AnalysisOxide ElectronicsApplied PhysicsAl FilmsFlexible SubstratesThin FilmsThin Film Processing
| Year | Citations | |
|---|---|---|
Page 1
Page 1